CNME – National Center for Electronic Microscopy

The National Center for Electronic Microscopy (CNME) is the main Transversal action of the Moncloa Campus of International Excellence. It is designed, in accordance with the study carried out by the FECYT on ICTS, to develop, implement and offer to the national and international scientific community the most advanced methods and techniques in transmission and scanning electron microscopy for the structural analysis of materials. This Center consists of a series of latest generation microscopes, instruments and techniques for advanced sample preparation. Computational imaging methods are also available..

LMA – Advanced Microscopy Laboratory

The Advanced Microscopy Laboratory, LMA, is integrated into the Río Ebro campus of Zaragoza University. It’s a unique initiative at national and international levels aimed at providing the Industrial and Scientific communities with the most advanced infrastructures in Nanofabrication, Local Probe and Electron Microscopies for the observation, characterization, nanopatterning and handling of materials at atomic and molecular scale.

DME ELECMI – Division of Electron Microscopy

The Electron Microscopy Division, DME, is integrated into the Central Services of Science and Technology (SC-ICYT) of Cádiz University. The infrastructure has a staff of technical personnel highly specialized in techniques such as microscopy of corrected aberrations (TEM, STEM), electron tomography and electron loss spectroscopy (EELS) and Dispersive X-ray energy (EDX). The main DME-UCA priorities are education, training and dissemination of innovative techniques and methods based on transmission electron microscopy and electron microscopy applicability to materials applied research.

UMEAP ELECMI – Electron Microscopy Unit Applied to Materials

The Unit of Electron Microscopy Applied to Materials (UMEAP-UB) is integrated in the Scientific and Technological Centers of the University of Barcelona (CCITUB). It has highly specialized personnel in transmission electron microscopy characterization techniques and related analytical techniques (EELS and EDXS spectroscopy), as well as advanced data processing and simulation. They have beam precession systems (for 3D electronic diffraction, electronic crystallography, recognition of crystalline phases and orientation and tension maps) and specific specimen holders for in-situ microscopy and electron tomography. They also offer TEM and SEM microscopy techniques for biological material (Cryo-Tomography, In-Situ Hybridization, etc.), and a wide selection of complementary characterization techniques, such as microprobes, X-ray diffractometers, Raman microscopy, ESCA, AFM, etc.